Dear All,

FYI – Call for papers for the special issue of IT Professional magazine on IT/IS Security.

Regards

San

San Murugesan

Editor in Chief, IEEE IT Professional
……………………………………………………………

www.computer.org/itpro

IT Security

Submission deadline: 1 June 2014
Publication: January/February 2015

This special issue of IT Professional seeks to provide readers with an overview of current issues and advances in information and computer security. We seek high quality contributions from industry, government, business, and academia that present recent developments in IT security, showcase successfully deployed security solutions, or discuss challenging security issues that deserve further study. Topics of interest include, but are not limited to, the following:

·        Authentication and access control

·        Biometrics

·        "Bring your own device" security

·        Cybersecurity challenges

·        Cloud and distributed system security

·        Computer forensics

·        The security of cyberphysical systems

·        Privacy issues in data mining and data analytics

·        Intrusion detection systems

·        The security of the Internet of Things

·        Malware detection

·        Mobile app security

·        Mobile device security

·        Network security

·        The legalities and ethics associated with security and privacy policies

·        The protection of personal information

·        Security architectures

·        Usability issues in security

·        Wearable device security

·        Web application security

·        The security of online transactions

Submissions

Feature articles should be no longer than 4,200 words and have no more than 20 references (with tables and figures counting as 300 words). Illustrations are welcome. For author guidelines, including sample articles, see www.computer.org/portal/web/peerreviewmagazines/acitpro.

Submit your article at https://mc.manuscriptcentral.com/itpro-cs.

Questions?

For more information, please contact the Guest Editors:

·        Morris Chang, Iowa State University, morris@iastate.edu

·        Rick Kuhn, NIST, kuhn@nist.gov