-------- Original-Nachricht -------- Betreff: Last Mile: VALID 2013 || October 27 - November 1, 2013 - Venice, Italy Datum: Sun, 09 Jun 2013 23:09:43 -0400 Von: VALID 2013 invitation@iariaannounce.org An: gustaf.neumann@wu-wien.ac.at
INVITATION:
=================
Please consider to contribute to and/or forward to the appropriate groups the following opportunity to submit and publish original scientific results to VALID 2013.
The submission deadline of June 20, 2013 is approaching.
Authors of selected papers will be invited to submit extended article versions to one of the IARIA Journals: http://www.iariajournals.org
=================
============== VALID 2013 | Call for Papers ===============
CALL FOR PAPERS, TUTORIALS, PANELS
VALID 2013, The Fifth International Conference on Advances in System Testing and Validation Lifecycle
October 27 - November 1, 2013 - Venice, Italy
General page: http://www.iaria.org/conferences2013/VALID13.html
Call for Papers: http://www.iaria.org/conferences2013/CfPVALID13.html
- regular papers
- short papers (work in progress)
- posters
Submission page: http://www.iaria.org/conferences2013/SubmitVALID13.html
Submission deadline: June 20, 2013
Sponsored by IARIA, www.iaria.org
Extended versions of selected papers will be published in IARIA Journals: http://www.iariajournals.org
Print proceedings will be available via Curran Associates, Inc.: http://www.proceedings.com/9769.html
Articles will be archived in the free access ThinkMind Digital Library: http://www.thinkmind.org
Please note the Poster and Work in Progress options.
The topics suggested by the conference can be discussed in term of concepts, state of the art, research, standards, implementations, running experiments, applications, and industrial case studies. Authors are invited to submit complete unpublished papers, which are not under review in any other conference or journal in the following, but not limited to, topic areas.
All tracks are open to both research and industry contributions, in terms of Regular papers, Posters, Work in progress, Technical/marketing/business presentations, Demos, Tutorials, and Panels.
Before submission, please check and conform with the Editorial rules: http://www.iaria.org/editorialrules.html
VALID 2013 Topics (topics and submission details: see CfP on the site)
Robust design methodologies
Designing methodologies for robust systems; Secure software techniques; Industrial real-time software; Defect avoidance; Cost models for robust systems; Design for testability; Design for reliability and variability; Design for adaptation and resilience; Design for fault-tolerance and fast recovery; Design for manufacturability, yield and reliability; Design for testability in the context of model-driven engineering
Vulnerability discovery and resolution
Vulnerability assessment; On-line error detection; Vulnerabilities in hardware security; Self-calibration; Alternative inspections; Non-intrusive vulnerability discovery methods; Embedded malware detection
Defects and Debugging
Debugging techniques; Component debug; System debug; Software debug; Hardware debug; System debug; Power-ground defects; Full-open defects in interconnecting lines; Physical defects in memories and microprocessors; Zero-defect principles
Diagnosis
Diagnosis techniques; Advances in silicon debug and diagnosis; Error diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical diagnostics; Testability and diagnosability; Diagnosis and testing in mo bile environments
System and feature testing
Test strategy for systems-in-package; Testing embedded systems; Testing high-speed systems; Testing delay and performance; Testing communication traffic and QoS/SLA metrics; Testing robustness; Software testing; Hardware testing; Supply-chain testing; Memory testing; Microprocessor testing; Mixed-signal production test; Testing multi-voltage domains; Interconnection and compatibility testing
Testing techniques and mechanisms
Fundamentals for digital and analog testing; Emerging testing methodologies; Engineering test coverage; Designing testing suites; Statistical testing; Functional testing; Parametric testing; Defect- and data-driven testing; Automated testing; Embedded testing; Autonomous self-testing; Low cost testing; Optimized testing; Testing systems and devices; Test standards
Testing of wireless communications systems
Testing of mobile wireless communication systems; Testing of wireless sensor networks; Testing of radio-frequency identification systems; Testing of ad-hoc networks; Testing methods for emerging standards; Hardware-based prototyping of wireless communication systems; Physical layer performance verification; On-chip testing of wireless communication systems; Modeling and simulation of wireless channels; Noise characterization and validation; Case studies and industrial applications of test instruments;
Software verification and validation
High-speed interface verification and fault-analysis; Software testing theory and practice; Model-based testing; Verification metrics; Service/application specific testing; Model checking; OO software testing; Testing embedded software; Quality assurance; Empirical studies for verification and validation; Software inspection techniques; Software testing tools; New approaches for software reliability verification and validation
Testing and validation of run-time evolving systems
Automated testing for run-time evolving systems; Testing and validation of evolving systems; Testing and validation of self-controlled systems; Testing compile-time versus run-time dependency for evolving systems; On-line validation and testing of evolving at run-time systems; Modeling for testability of evolving at run-time systems; Near real-time and real-time monitoring of run-time evolving systems; Verification and validation of reflective models for testing; Verification and validation of fault tolerance in run-time evolving systems
Feature-oriented testing
Testing user interfaces and user-driven features; Privacy testing; Ontology accuracy testing; Testing semantic matching; Testing certification processes; Testing authentication mechanisms; Testing biometrics methodologies and mechanisms; Testing cross-nation systems; Testing system interoperability; Testing system safety; Testing system robustness; Testing temporal constraints; Testing transaction-based properties; Directed energy test capabilities /microwave, laser, etc./; Testing delay and latency metrics
Domain-oriented testing
Testing autonomic and autonomous systems; Testing intrusion prevention systems; Firewall testing; Information assurance testing; Testing social network systems; Testing recommender systems; Testing biometric systems; Testing diagnostic systems; Testing on-line systems; Testing financial systems; Testing life threatening systems; Testing emergency systems; Testing sensor-based systems; Testing testing systems
Committee: http://www.iaria.org/conferences2013/ComVALID13.html
================================================
To stop receiving notices about VALID, please reply with "DROP VALID gustaf.neumann@wu-wien.ac.at" in the subject field.
To receive notices about specific topics only, please reply with "TOPIC CHANGE gustaf.neumann@wu-wien.ac.at" in the subject field, and the specific topics in the email body.
To stop receiving any notice, please reply with "UNSUBSCRIBE gustaf.neumann@wu-wien.ac.at" in the subject field.