-------- Forwarded Message -------- Subject: [computational.science] CFP: Resilience@Euro-Par 2019 - Papers due May 10 Date: Mon, 1 Apr 2019 21:18:55 +0000 From: Engelmann, Christian via computational.science computational.science@lists.iccsa.org Reply-To: Engelmann, Christian engelmannc@ornl.gov To: sdmas@googlegroups.com sdmas@googlegroups.com, TCSC@cse.stfx.ca TCSC@cse.stfx.ca, Computational Science List computational.science@lists.iccsa.org, Zhou, Jiang via hpc-announce hpc-announce@mcs.anl.gov
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12th Workshop on Resiliency in High Performance Computing (Resilience) in Clusters, Clouds, and Grids https://www.csm.ornl.gov/srt/conferences/Resilience/2019
in conjunction with
the 25th International European Conference on Parallel and Distributed Computing (Euro-Par), Göttingen, Germany August 26 - 30, 2019 http://2019.euro-par.org
Overview:
Resilience is a critical challenge as high performance computing (HPC) systems continue to increase component counts, individual component reliability decreases (such as due to shrinking process technology and near-threshold voltage (NTV) operation), software complexity increases, and architectures become more heterogeneous. Application correctness and execution efficiency, in spite of frequent faults, errors, and failures, is essential to ensure the success of the extreme-scale HPC systems, cluster computing environments, Grid computing infrastructures, and Cloud computing services.
While a fault (e.g., a bug or stuck bit) is the cause of an error, its manifestation as a state change is considered an error (e.g., a bad value or incorrect execution), and the transition to an incorrect service is observed as a failure (e.g., an application abort or system crash). A failure in a computing system is typically observed through an application abort or a full/partial service or system outage. A detectable correctable error is often transparently handled by hardware, such as a single bit flip in memory that is protected with single-error correction double-error detection (SECDED) error correcting code (ECC). A detectable uncorrectable error (DUE) typically results in a failure, such as multiple bit flips in the same addressable word that escape SECDED ECC correction, but not detection, and ultimately cause an application abort. An undetectable error (UE) may result in silent data corruption (SDC), e.g., an incorrect application output. There are many other types of hardware and software faults, errors, and failures in computing systems.
Resilience for HPC systems encompasses a wide spectrum of fundamental and applied research and development, including theoretical foundations, fault detection and prediction, monitoring and control, end-to-end data integrity, enabling infrastructure, and resilient solvers and algorithm-based fault tolerance. This workshop brings together experts in the community to further research and development in HPC resilience and to facilitate exchanges across the computational paradigms of extreme-scale HPC, cluster computing, Grid computing, and Cloud computing.
Submission Guidelines:
Authors are invited to submit papers electronically in English in PDF format. Submitted manuscripts should be structured as technical papers and BETWEEN 10 AND 12 PAGES, including figures, tables and references, using Springer's Lecture Notes in Computer Science (LNCS) format at http://www.springer.com/computer/lncs?SGWID=0-164-6-793341-0. Papers with less than 10 or more than 12 pages will not be accepted due to publisher guidelines. Submissions should include abstract, key words and the e-mail address of the corresponding author. Papers not conforming to these guidelines may be returned without review. All manuscripts will be reviewed and will be judged on correctness, originality, technical strength, significance, quality of presentation, and interest and relevance to the conference attendees. Submitted papers must represent original unpublished research that is not currently under review for any other conference or journal. Papers not following these guidelines will be rejected without review and further action may be taken, including (but not limited to) notifications sent to the heads of the institutions of the authors and sponsors of the conference. Submissions received after the due date or not appropriately structured may also not be considered. The proceedings will be published in Springer's LNCS as post-conference proceedings. At least one author of an accepted paper must register for and attend the workshop for inclusion in the proceedings. Authors may contact the workshop program chairs for more information.
Important websites:
- Resilience 2019 Website: https://www.csm.ornl.gov/srt/conferences/Resilience/2019 - Resilience 2019 Submissions: https://easychair.org/my/conference.cgi?conf=europar2019workshops - Euro-Par 2019 website: http://2019.euro-par.org
Topics of interest include, but are not limited to:
- Theoretical foundations for resilience: - Metrics and measurement - Statistics and optimization - Simulation and emulation - Formal methods - Efficiency modeling and uncertainty quantification
- Fault detection and prediction: - Statistical analyses - Machine learning - Anomaly detection - Data and information collection - Visualization
- Monitoring and control for resilience: - Platform and application monitoring - Response and recovery - RAS theory and performability - Application and platform knobs - Tunable fidelity and quality of service
- End-to-end data integrity: - Fault tolerant design - Degraded modes - Forward migration and verification - Fault injection - Soft errors - Silent data corruption
- Enabling infrastructure for resilience: - RAS systems - System software and middleware - Programming models - Tools - Next-generation architectures, including heterogeneous architectures
- Resilient solvers and algorithm-based fault tolerance: - Algorithmic detection and correction of hard and soft faults - Resilient algorithms - Fault tolerant numerical methods - Robust iterative algorithms - Scalability of resilient solvers and algorithm-based fault tolerance
Important Dates:
- Workshop papers due: May 10, 2019 - Workshop author notification: June 28, 2019 - Workshop author registration: July 15, 2019 - Workshop paper (for informal workshop proceedings): July 22, 2019 - Workshop date: August 26 or 27, 2019 - Workshop camera-ready papers: TBD (after the conference)
General Co-Chairs:
- Stephen L. Scott Senior Research Scientist - Systems Research Team Tennessee Tech University and Oak Ridge National Laboratory, USA scottsl@ornl.gov - Chokchai (Box) Leangsuksun, SWEPCO Endowed Associate Professor of Computer Science Louisiana Tech University, USA box@latech.edu
Program Co-Chairs:
- Patrick G. Bridges University of New Mexico, USA bridges@cs.unm.edu - Christian Engelmann Oak Ridge National Laboratory , USA engelmannc@ornl.gov
Program Committee:
- Rizwan Ashraf, Oak Ridge National Laboratory, USA - Wesley Bland, Intel Corporation, USA - Hans-Joachim Bungartz, Technical University of Munich, Germany - Marc Casas, Barcelona Supercomputer Center, Spain - Robert Clay, Sandia National Laboratories, USA - Nathan DeBardeleben, Los Alamos National Laboratory, USA - James Elliott, Sandia National Laboratories, USA - Kurt Ferreira, Sandia National Laboratories, USA - Saurabh Hukerikar, NVIDIA, USA - Dieter Kranzlmueller, Ludwig-Maximilians University of Munich, Germany - Ignacio Laguna, Lawrence Livermore National Laboratory, USA - Scott Levy, University of New Mexico, USA - Dirk Pflueger, University of Stuttgart, Germany - Alexander Reinefeld, Zuse Institute Berlin, Germany - Rolf Riesen, Intel Corporation, USA - Yves Robert, ENS Lyon, France - Thomas Ropars, Universite Grenoble Alpes, France - Martin Schulz, Technical University of Munich, Germany - Keita Teranishi, Sandia National Laboratories, USA
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Christian Engelmann, Ph.D.
Senior R&D Staff Scientist Computer Science Research Group Computer Science and Mathematics Division Oak Ridge National Laboratory
Mail: P.O. Box 2008, Oak Ridge, TN 37831-6173, USA Phone: +1 (865) 574-3132 / Fax: +1 (865) 576-5491 e-Mail: engelmannc@ornl.gov / Home: www.christian-engelmann.info
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